Arun Lobo
3Patents
1h-index
11Co-inventors
34Inventor score
Filing activity: Aug 3, 2016 → Aug 14, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10359706B1 | Integrated scanning electron microscopy and optical analysis techniques for advanced process control | Physics | 2 | Active |
| US10204416B2 | Automatic deskew using design files or inspection images | Electricity | 1 | Active |
| US9947596B2 | Range-based real-time scanning electron microscope non-visual binner | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.