Atsushi Obuchi
2Patents
1h-index
7Co-inventors
37Inventor score
Filing activity: Nov 18, 2003 → Feb 24, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7358953B2 | Semiconductor device and testing method of semiconductor device | Emerging Cross-Sectional Technologies | 1 | Expired |
| US10026699B2 | Integrated circuit chip and integrated circuit wafer with guard ring | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.