Semiconductor device and testing method of semiconductor device
US7358953B2 · kind B2 · utility
1Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 18, 2003 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Dec 5, 2024 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S345/904
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor device having a liquid crystal driving circuit is disclosed. The driving circuit includes a digital functional unit and an analog functional unit. The digital functional unit is comprised of a display controller and a display data storage RAM, while the analog functional unit is made up of a gradation voltage generating circuit and a gradation voltage selecting circuit. The digital and analog function units are functionally divided from each other and testing of the digital function and testing of the analog function unit are performed in an overlapping manner independently from each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.