Azrul Halim
3Patents
3h-index
7Co-inventors
36Inventor score
Filing activity: Sep 5, 2000 → Jul 22, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6631086B1 | On-chip repair of defective address of core flash memory cells | Physics | 94 | Expired |
| US6707718B1 | Generation of margining voltage on-chip during testing CAM portion of flash memory device | Physics | 25 | Expired |
| US6587982B1 | Method of micro-architectural implementation of interface between bist state machine and tester interface to enable bist cycling | Physics | 7 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.