Ballson Gopal
4Patents
2h-index
3Co-inventors
37Inventor score
Filing activity: Sep 30, 2004 → Jun 8, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7151388B2 | Method for testing semiconductor devices and an apparatus therefor | Physics | 47 | Expired |
| US11061069B2 | Burn-in test apparatus for semiconductor devices | Physics | 2 | Active |
| US11768224B2 | Test and burn-in apparatus that provides variable thermal resistance | Physics | 0 | Active |
| US11719743B2 | Method and apparatus for conducting burn-in testing of semiconductor devices | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.