Boaz Kenane
3Patents
2h-index
4Co-inventors
33Inventor score
Filing activity: Mar 23, 2011 → Jan 9, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8283644B2 | Measuring in-situ UV intensity in UV cure tool | Electricity | 19 | Active |
| US10334412B1 | Autonomous vehicle assistance systems | Performing Operations; Transporting | 3 | Active |
| US9953887B2 | Measuring individual layer thickness during multi-layer deposition semiconductor processing | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.