Brandon L. Ward
2Patents
1h-index
4Co-inventors
30Inventor score
Filing activity: Jul 7, 2004 → Sep 28, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7285781B2 | Characterizing resist line shrinkage due to CD-SEM inspection | Physics | 9 | Expired |
| US7829852B2 | Device having etched feature with shrinkage carryover | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.