Brian Trapp
5Patents
2h-index
18Co-inventors
40Inventor score
Filing activity: Jun 10, 2003 → Jan 9, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7752581B2 | Design structure and system for identification of defects on circuits or other arrayed products | Electricity | 13 | Active |
| US7346470B2 | System for identification of defects on circuits or other arrayed products | Electricity | 5 | Expired |
| US7751920B2 | Method and system of data weighted object orientation for data mining | Physics | 0 | Active |
| US7477961B2 | Equivalent gate count yield estimation for integrated circuit devices | Physics | 0 | Active |
| US8429193B2 | Security control of analysis results | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.