Bruce D. Sudweeks
2Patents
1h-index
5Co-inventors
37Inventor score
Filing activity: Nov 30, 1995 → Oct 25, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5606568A | Method and apparatus for performing serial and parallel scan testing on an integrated circuit | Physics | 21 | Expired |
| US7509226B2 | Apparatus and method for testing non-deterministic device data | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.