Inventor · Tuscaloosa, AL, US

Bruce Kim

8Patents
5h-index
17Co-inventors
56Inventor score

Filing activity: Jul 31, 1998 → Dec 29, 2010

Most-cited inventions

PatentTitleAreaCited byStatus
US6111414A System, circuit, and method for testing an interconnect in a multi-chip substrate Physics 25 Expired
US6870930B1 Methods and systems for TMDS encryption Electricity 23 Expired
US7158593B2 Combining a clock signal and a data signal Electricity 17 Expired
US7991096B1 Data sampling method and apparatus using through-transition counts to reject worst sampling position Electricity 10 Active
US7236553B1 Reduced dead-cycle, adaptive phase tracking method and apparatus Electricity 7 Expired
US7062004B1 Method and apparatus for adaptive control of PLL loop bandwidth Electricity 3 Expired
US7129719B2 Apparatus for detecting defect in circuit pattern and defect detecting system having the same Physics 3 Expired
US8742777B2 Method and system for testing an electric circuit Physics 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.