Chen Dror
4Patents
3h-index
11Co-inventors
43Inventor score
Filing activity: Mar 4, 2014 → May 3, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9910953B2 | Metrology target identification, design and verification | Electricity | 5 | Active |
| US10387608B2 | Metrology target identification, design and verification | Electricity | 4 | Active |
| US11353799B1 | System and method for error reduction for metrology measurements | Electricity | 3 | Active |
| US11978679B2 | Substrate with cut semiconductor pieces having measurement test structures for semiconductor metrology | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.