Chien-Chih Wu
4Patents
1h-index
5Co-inventors
33Inventor score
Filing activity: Jan 28, 2016 → Oct 19, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11177183B2 | Thickness measurement system and method | Electricity | 2 | Active |
| US12040205B2 | Systems and methods for inspection stations | Electricity | 0 | Active |
| US9947610B2 | Semiconductor structure and method for manufacturing the same | Electricity | 0 | Active |
| US10811290B2 | Systems and methods for inspection stations | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.