Inventor · Baoshan, TW

Ching-Ying Lee

8Patents
6h-index
7Co-inventors
48Inventor score

Filing activity: Apr 28, 1995 → Aug 10, 2000

Most-cited inventions

PatentTitleAreaCited byStatus
US5849640A In-situ SOG etchback and deposition for IMD process Electricity 34 Expired
US5591672A Annealing of titanium - titanium nitride in contact hole Electricity 27 Expired
US5552340A Nitridation of titanium, for use with tungsten filled contact holes Electricity 20 Expired
US6008137A Pattern formation of silicon nitride Electricity 9 Expired
US5922622A Pattern formation of silicon nitride Electricity 9 Expired
US5846880A Process for removing titanium nitride layer in an integrated circuit Electricity 6 Expired
US6107201A Aluminum spiking inspection method Electricity 4 Expired
US6446252B1 Photomask method for making the same capacitor cell area near outmost cell arrays Physics 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.