Chiu Hsiu Chen
3Patents
2h-index
9Co-inventors
30Inventor score
Filing activity: Apr 10, 2012 → Nov 13, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9367655B2 | Topography-aware lithography pattern check | Electricity | 64 | Active |
| US8910092B1 | Model based simulation method with fast bias contour for lithography process check | Physics | 3 | Active |
| US8952329B1 | 3D image profiling techniques for lithography | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.