Chris Maher
9Patents
4h-index
37Co-inventors
53Inventor score
Filing activity: Sep 21, 2007 → Oct 15, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8126255B2 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions | Physics | 146 | Active |
| US8073240B2 | Computer-implemented methods, computer-readable media, and systems for identifying one or more optical modes of an inspection system as candidates for use in inspection of a layer of a wafer | Physics | 24 | Active |
| US8135204B1 | Computer-implemented methods, carrier media, and systems for creating a defect sample for use in selecting one or more parameters of an inspection recipe | Physics | 20 | Active |
| US8000922B2 | Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm | Physics | 11 | Active |
| US10832396B2 | And noise based care areas | Physics | 4 | Active |
| US8537349B2 | Monitoring of time-varying defect classification performance | Emerging Cross-Sectional Technologies | 4 | Active |
| US10604433B2 | Emancipative waste activated sludge stripping to remove internal phosphorus (“eWASSTRIP”) | Chemistry; Metallurgy | 1 | Active |
| US9489599B2 | Decision tree construction for automatic classification of defects on semiconductor wafers | Physics | 0 | Active |
| US11114324B2 | Defect candidate generation for inspection | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.