Christopher Sears
12Patents
3h-index
18Co-inventors
49Inventor score
Filing activity: Mar 9, 2012 → Aug 27, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9165742B1 | Inspection site preparation | Electricity | 11 | Active |
| US10338013B1 | Position feedback for multi-beam particle detector | Electricity | 4 | Active |
| US9082580B2 | Notched magnetic lens for improved sample access in an SEM | Electricity | 3 | Active |
| US8752437B2 | Magnet strength measurement | Physics | 2 | Active |
| US10460903B2 | Method and system for charge control for imaging floating metal structures on non-conducting substrates | Electricity | 0 | Active |
| US10790114B2 | Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages | Electricity | 0 | Active |
| US11087950B2 | Charge control device for a system with multiple electron beams | Electricity | 0 | Active |
| US9653257B2 | Method and system for reducing charging artifacts in scanning electron microscopy images | Electricity | 0 | Active |
| US9892885B2 | System and method for drift compensation on an electron beam based characterization tool | Electricity | 0 | Active |
| US9232626B2 | Wafer grounding using localized plasma source | Electricity | 0 | Active |
| US11302511B2 | Field curvature correction for multi-beam inspection systems | Electricity | 0 | Active |
| US9171694B2 | Asymmetric electrostatic quadrupole deflector for improved field uniformity | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.