Christopher Storm
5Patents
1h-index
12Co-inventors
44Inventor score
Filing activity: Feb 18, 2011 → May 27, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9991152B2 | Wafer-handling end effectors with wafer-contacting surfaces and sealing structures | Emerging Cross-Sectional Technologies | 2 | Active |
| US10060950B2 | Shielded probe systems | Physics | 1 | Active |
| US11047795B2 | Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems | Physics | 0 | Active |
| US8167648B2 | Low noise connector with cables having a center, middle and outer conductors | Electricity | 0 | Active |
| US10698002B2 | Probe systems for testing a device under test | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.