Craig Henry
7Patents
4h-index
20Co-inventors
53Inventor score
Filing activity: Jun 27, 2003 → Mar 29, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7423263B2 | Planar view sample preparation | Electricity | 36 | Active |
| US7348556B2 | Method of measuring three-dimensional surface roughness of a structure | Physics | 35 | Active |
| US7511282B2 | Sample preparation | Emerging Cross-Sectional Technologies | 27 | Active |
| US6926935B2 | Proximity deposition | Electricity | 12 | Expired |
| US9653260B2 | High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella | Electricity | 3 | Active |
| US11158487B2 | Diagonal compound mill | Electricity | 0 | Active |
| US10283317B2 | High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.