Dag Sonntag
5Patents
1h-index
21Co-inventors
40Inventor score
Filing activity: Mar 29, 2018 → Jun 30, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11086229B2 | Method to predict yield of a device manufacturing process | Physics | 1 | Active |
| US12353967B2 | Method and apparatus for determining feature contribution to performance | Emerging Cross-Sectional Technologies | 0 | Active |
| US12045555B2 | Method to label substrates based on process parameters | Physics | 0 | Active |
| US11714357B2 | Method to predict yield of a device manufacturing process | Physics | 0 | Active |
| US11099485B2 | Maintaining a set of process fingerprints | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.