Dan Campion
3Patents
1h-index
6Co-inventors
33Inventor score
Filing activity: Jul 10, 2014 → Sep 4, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9696347B2 | Testing apparatus and method for microcircuit and wafer level IC testing | Emerging Cross-Sectional Technologies | 2 | Active |
| US10928423B2 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | Physics | 0 | Active |
| US10067164B2 | Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.