Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
US10067164B2 · kind B2 · utility
0Cited by
3References
16Claims
0Family size
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Key dates
| Filing date | Aug 24, 2016 |
| Grant date | Sep 4, 2018 |
| Priority date | — |
| Expiry date | Apr 15, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.