Daniel M. Boyne
4Patents
3h-index
6Co-inventors
39Inventor score
Filing activity: Nov 2, 1992 → Apr 17, 1997
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5470788A | Method of making self-aligned, lateral diffusion barrier in metal lines to eliminate electromigration | Emerging Cross-Sectional Technologies | 51 | Expired |
| US6597067B1 | Self-aligned, lateral diffusion barrier in metal lines to eliminate electromigration | Emerging Cross-Sectional Technologies | 30 | Expired |
| US5563517A | Dual channel d.c. low noise measurement system and test methodology | Physics | 5 | Expired |
| US5434385A | Dual channel D.C. low noise measurement system and test methodology | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.