Darren Lee Rust
3Patents
1h-index
5Co-inventors
30Inventor score
Filing activity: Oct 30, 2003 → Dec 14, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7043317B1 | Semiconductor wafer fabrication furnace idle monitor and method of operation | Emerging Cross-Sectional Technologies | 2 | Expired |
| US7470594B1 | System and method for controlling the formation of an interfacial oxide layer in a polysilicon emitter transistor | Emerging Cross-Sectional Technologies | 1 | Expired |
| US7065424B1 | Systems and methods that monitor re-qualification indicia associated with durable items to ensure physical process quality | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.