David E. Sweenor
3Patents
2h-index
14Co-inventors
31Inventor score
Filing activity: May 21, 2004 → Aug 10, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7194706B2 | Designing scan chains with specific parameter sensitivities to identify process defects | Electricity | 13 | Expired |
| US7558999B2 | Learning based logic diagnosis | Physics | 4 | Expired |
| US7089514B2 | Defect diagnosis for semiconductor integrated circuits | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.