Learning based logic diagnosis
US7558999B2 · kind B2 · utility
4Cited by
17References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 21, 2004 |
| Grant date | Jul 7, 2009 |
| Priority date | — |
| Expiry date | Oct 21, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/261
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for diagnosing a failure in an electronic device. A disclosed system comprises: a defect table that associates previously studied features with known failures; and a fault isolation system that compares an inputted set of suspected faulty device features with the previously studied features listed in the defect table in order to identify causes of the failure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.