David Goodstein
2Patents
2h-index
8Co-inventors
33Inventor score
Filing activity: Aug 11, 1999 → Aug 13, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6384408B1 | Calibration of a scanning electron microscope | Electricity | 22 | Expired |
| US7098456B1 | Method and apparatus for accurate e-beam metrology | Electricity | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.