Inventor · Helsinki, FI

David GUNNARSSON

2Patents
1h-index
6Co-inventors
27Inventor score

Filing activity: Apr 29, 2020 → Apr 29, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US11181574B2 Testing device includes radiation shields for testing integrated circuits on a wafer Physics 1 Active
US11226364B2 Testing device Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.