David L. Willenborg
8Patents
7h-index
7Co-inventors
52Inventor score
Filing activity: May 17, 1978 → Aug 15, 1995
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4999014A | Method and apparatus for measuring thickness of thin films | Physics | 360 | Expired |
| US5042951A | High resolution ellipsometric apparatus | Physics | 347 | Expired |
| US5412473A | Multiple angle spectroscopic analyzer utilizing interferometric and ellipsometric devices | Physics | 150 | Expired |
| US5596406A | Sample characteristic analysis utilizing multi wavelength and multi angle polarization and magnitude change detection | Physics | 145 | Expired |
| US4579463A | Detecting thermal waves to evaluate thermal parameters | Physics | 127 | Expired |
| US5159412A | Optical measurement device with enhanced sensitivity | Physics | 114 | Expired |
| US4795260A | Apparatus for locating and testing areas of interest on a workpiece | Physics | 72 | Expired |
| US4188118A | Manipulator for rotating and examining small spheres | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.