Detecting thermal waves to evaluate thermal parameters
US4579463A · kind A · utility
127Cited by
11References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 21, 1984 |
| Grant date | Apr 1, 1986 |
| Priority date | — |
| Expiry date | May 21, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/72
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus is disclosed for detecting thermal waves. This system is based on the measurement of the change in reflectivity at the sample surface which is a function of the changing surface temperature. The apparatus includes a radiation probe beam that is directed on a portion of the area which is being periodically heated. A photodetector is aligned to sense the intensity changes in the reflected radiation probe beam which results from the periodic heating. These signals are processed to detect the presence of thermal waves.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.