Devis Contarato
6Patents
2h-index
13Co-inventors
37Inventor score
Filing activity: Aug 25, 2015 → Jun 12, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9767986B2 | Scanning electron microscope and methods of inspecting and reviewing samples | Electricity | 9 | Active |
| US10462391B2 | Dark-field inspection using a low-noise sensor | Electricity | 2 | Active |
| US10466212B2 | Scanning electron microscope and methods of inspecting and reviewing samples | Electricity | 2 | Active |
| US10778925B2 | Multiple column per channel CCD sensor architecture for inspection and metrology | Physics | 1 | Active |
| US10313622B2 | Dual-column-parallel CCD sensor and inspection systems using a sensor | Electricity | 1 | Active |
| US10764527B2 | Dual-column-parallel CCD sensor and inspection systems using a sensor | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.