Do-young Kam
5Patents
4h-index
15Co-inventors
50Inventor score
Filing activity: Jul 18, 1996 → Nov 9, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5850146A | Probe apparatus for electrical inspection of printed circuit board assembly | Physics | 16 | Expired |
| US7554349B2 | Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments | Physics | 8 | Active |
| US7101442B2 | Reaction apparatus | Electricity | 6 | Expired |
| US7838790B2 | Multifunctional handler system for electrical testing of semiconductor devices | Emerging Cross-Sectional Technologies | 5 | Active |
| US7701546B2 | Method and apparatus for manufacturing an LCD | Performing Operations; Transporting | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.