Dov Shachal
10Patents
4h-index
2Co-inventors
46Inventor score
Filing activity: May 14, 1999 → Apr 15, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8164057B2 | Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope | Electricity | 16 | Active |
| US6627886B1 | Secondary electron spectroscopy method and system | Emerging Cross-Sectional Technologies | 14 | Expired |
| US8334510B2 | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment | Electricity | 13 | Active |
| US8492716B2 | Vacuumed device and a scanning electron microscope | Emerging Cross-Sectional Technologies | 7 | Active |
| US8779358B2 | Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope | Electricity | 4 | Active |
| US8981294B2 | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment | Electricity | 3 | Active |
| US9076631B2 | Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope | Electricity | 2 | Active |
| US9431213B2 | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment | Electricity | 1 | Active |
| US9287089B2 | Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope | Electricity | 0 | Active |
| US9466458B2 | Scanning electron microscope | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.