Edward James
7Patents
3h-index
24Co-inventors
53Inventor score
Filing activity: May 21, 2004 → Nov 29, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7714287B1 | Apparatus and method for obtaining topographical dark-field images in a scanning electron microscope | Electricity | 44 | Active |
| US7075073B1 | Angle resolved x-ray detection | Physics | 11 | Expired |
| US9966220B2 | Electron energy loss spectrometer using direct detection sensor | Electricity | 3 | Active |
| US7115866B1 | Site stepping for electron beam micro analysis | Electricity | 2 | Expired |
| US11024484B2 | Method for high speed EELS spectrum acquisition | Electricity | 1 | Active |
| US10364390B2 | High density fast phosphor for electron microscopy | Physics | 0 | Active |
| US10535492B2 | Electron energy loss spectrometer using direct detection sensor | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.