Inventor · Talmei Yehiel, IL

Elad Dotan

5Patents
1h-index
14Co-inventors
44Inventor score

Filing activity: Jul 2, 2013 → Aug 23, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US9651498B2 Optical method and system for detecting defects in three-dimensional structures Physics 1 Active
US11994374B2 Integrated measurement system Physics 1 Active
US11512943B2 Optical system and method for measuring parameters of patterned structures in micro-electronic devices Physics 0 Active
US12194488B2 Coating system with an adjustable gap between two rollers Performing Operations; Transporting 0 Active
US10018574B2 Optical method and system for defects detection in three-dimensional structures Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.