Eldad Langmans
3Patents
2h-index
6Co-inventors
33Inventor score
Filing activity: Apr 10, 2011 → Jul 12, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9756313B2 | High throughput and low cost height triangulation system and method | Physics | 4 | Active |
| US8731274B2 | Method and system for wafer registration | Physics | 2 | Active |
| US10215707B2 | System for inspecting a backside of a wafer | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.