Eli Kurin
3Patents
2h-index
6Co-inventors
30Inventor score
Filing activity: Oct 19, 2009 → Dec 6, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8471215B1 | Integrated circuit sample preparation for alpha emission measurements | Physics | 5 | Active |
| US8829898B1 | Method and apparatus for testing | Physics | 2 | Active |
| US8330117B1 | Integrated circuit sample preparation for alpha emission measurements | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.