Patent · US Active

Method and apparatus for testing

US8829898B1 · kind B1 · utility

2Cited by

2References

20Claims

0Family size

Assignee

Marvell Israel (M.I.S.L) Ltd. · IL

Inventors

Yosef Solt · Sachnin, IL
Asaf Idan · Rehovot, IL
Ofer Benjamin · Netanya, IL
Eli Kurin · Jerusalem, IL

Key dates

Filing date	Jun 7, 2011
Grant date	Sep 9, 2014
Priority date	—
Expiry date	Feb 17, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2879
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Aspects of the disclosure provide a method for testing. The method includes determining an electrical characteristic of an integrated circuit (IC), subjecting the IC to a stress test, characterizing the electrical characteristic of the IC subsequently to subjecting the IC to the stress test, and determining a quality attribute of the IC based on a comparison of the respective electrical characteristics of the IC before and after subjecting the IC to the stress test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.