Eric Bouche
4Patents
1h-index
6Co-inventors
30Inventor score
Filing activity: Oct 27, 2004 → Jun 2, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7109735B1 | Method for measuring gate dielectric properties for three dimensional transistors | Physics | 1 | Expired |
| US7606677B1 | Dynamic measurement control | Electricity | 1 | Expired |
| US7345306B1 | Corona based charge voltage measurement | Physics | 0 | Active |
| US7098050B1 | Corona based charge voltage measurement | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.