Eric Vella
8Patents
5h-index
21Co-inventors
63Inventor score
Filing activity: May 3, 2002 → Jan 12, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6833913B1 | Apparatus and methods for optically inspecting a sample for anomalies | Physics | 20 | Expired |
| US6686995B2 | Two-dimensional UV compatible programmable spatial filter | Physics | 14 | Expired |
| US6775051B2 | Systems and methods for scanning a beam of light across a specimen | Physics | 12 | Expired |
| US7012683B2 | Apparatus and methods for optically inspecting a sample for anomalies | Physics | 6 | Expired |
| US6686994B2 | UV compatible programmable spatial filter | Physics | 5 | Expired |
| US9875534B2 | Techniques and systems for model-based critical dimension measurements | Physics | 2 | Active |
| US11131629B2 | Apparatus and methods for measuring phase and amplitude of light through a layer | Physics | 2 | Active |
| US12092814B2 | Correcting aberration and apodization of an optical system using correction plates | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.