Felix Beaudoin
5Patents
2h-index
7Co-inventors
33Inventor score
Filing activity: Jul 9, 2004 → Sep 30, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6967491B2 | Spatial and temporal selective laser assisted fault localization | Physics | 18 | Expired |
| US7408342B2 | Device for measuring a component of current based on magnetic fields | Physics | 3 | Expired |
| US7411391B2 | Magnetic-field-measuring probe | Physics | 2 | Expired |
| US7417424B2 | Magnetic-field-measuring device | Physics | 2 | Expired |
| US7560940B2 | Method and installation for analyzing an integrated circuit | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.