Frank Hoffmann
5Patents
3h-index
8Co-inventors
50Inventor score
Filing activity: Jan 29, 1981 → Oct 31, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7812966B2 | Method of determining the depth profile of a surface structure and system for determining the depth profile of a surface structure | Physics | 15 | Active |
| US4378572A | Camera interface | Emerging Cross-Sectional Technologies | 14 | Expired |
| US8481400B2 | Semiconductor manufacturing and semiconductor device with semiconductor structure | Performing Operations; Transporting | 8 | Active |
| US9812369B2 | BiMOS device with a fully self-aligned emitter-silicon and method for manufacturing the same | Electricity | 1 | Active |
| US10312159B2 | BiMOS device with a fully self-aligned emitter-silicon and method for manufacturing the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.