Gaozeng Cui
2Patents
0h-index
7Co-inventors
27Inventor score
Filing activity: Aug 19, 2014 → Jul 8, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11940377B2 | Device and method for detecting a surface defect using interference between polarized lights | Physics | 0 | Active |
| US11187649B2 | Method for conducting optical measurement usingfull Mueller matrix ellipsometer | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.