Gerd Scheuring
2Patents
0h-index
4Co-inventors
21Inventor score
Filing activity: Mar 19, 2004 → Sep 17, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7460962B2 | Method for an automatic optical measuring of an OPC structure | Physics | 0 | Active |
| US7375792B2 | Apparatus for measuring feature widths on masks for the semiconductor industry | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.