Glenn M. Stefanski
3Patents
0h-index
7Co-inventors
27Inventor score
Filing activity: May 14, 2009 → May 26, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9791849B2 | Defect detection process in a semiconductor manufacturing environment | Emerging Cross-Sectional Technologies | 0 | Active |
| US8299926B2 | System and method for safeguarding wafers and photomasks | Physics | 0 | Active |
| US8749388B2 | System and method for safeguarding wafers and photomasks | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.