Grant McNeil
2Patents
2h-index
4Co-inventors
30Inventor score
Filing activity: Jun 17, 2003 → Jan 3, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6943396B2 | Electro-static discharge protection circuit and method for making the same | Electricity | 7 | Expired |
| US7257038B2 | Test mode for IPP current measurement for wordline defect detection | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.