Greg Rupper
3Patents
1h-index
4Co-inventors
33Inventor score
Filing activity: Feb 21, 2017 → Jun 9, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11675002B2 | Terahertz plasmonics for testing very large-scale integrated circuits under bias | Physics | 1 | Active |
| US10890618B2 | Terahertz plasmonics for testing very large-scale integrated circuits under bias | Physics | 1 | Active |
| US12360159B2 | Terahertz plasmonics for testing very large-scale integrated circuits under bias | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.