Guy Ben Dov
4Patents
2h-index
19Co-inventors
37Inventor score
Filing activity: Jan 22, 2014 → Nov 8, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9739702B2 | Symmetric target design in scatterometry overlay metrology | Physics | 22 | Active |
| US10591406B2 | Symmetric target design in scatterometry overlay metrology | Physics | 4 | Active |
| US9909982B2 | Pupil plane calibration for scatterometry overlay measurement | Physics | 1 | Active |
| US10990022B2 | Field-to-field corrections using overlay targets | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.