Inventor · Oberhaching, DE

Henning Hartmann

2Patents
1h-index
4Co-inventors
27Inventor score

Filing activity: Jul 18, 2001 → Nov 30, 2001

Most-cited inventions

PatentTitleAreaCited byStatus
US6895538B2 Method for testing a device and a test configuration including a device with a test memory Electricity 22 Expired
US6515514B2 Method and circuit configuration for controlling a data driver Electricity 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.