Patent · US Expired

Method for testing a device and a test configuration including a device with a test memory

US6895538B2 · kind B2 · utility

22Cited by

9References

12Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Alexander Benedix · Hersbruck, DE
Henning Hartmann · Oberhaching, DE
Reinhard Düregger · Poing, DE
Wolfgang Ruf · Friedberg, DE

Key dates

Filing date	Jul 18, 2001
Grant date	May 17, 2005
Priority date	—
Expiry date	Dec 25, 2022

Classification

Technology area (CPC H)Electricity
CPC primaryH01L2924/0002
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A test configuration that includes a device and a method for testing the device in which test results determined during the testing of the device are stored in a memory in the device. In this way, the test results are connected with the device and available at any time for later evaluations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.