Hidekazu Mimura
5Patents
1h-index
3Co-inventors
36Inventor score
Filing activity: Feb 15, 2007 → Feb 3, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9892811B2 | Optical design method for X-ray focusing system using rotating mirror, and X-ray focusing system | Physics | 1 | Active |
| US8744046B2 | Method and apparatus of precisely measuring intensity profile of X-ray nanobeam | Physics | 1 | Active |
| US7616324B2 | Ultra precision profile measuring method | Physics | 0 | Active |
| US7936860B2 | X-ray condensing method and its device using phase restoration method | Physics | 0 | Active |
| US8000443B2 | High precision posture control method of X-ray mirror | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.